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Publikācija: Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films

Publication Type Conference paper
Funding for basic activity Unknown
Defending: ,
Publication language English (en)
Title in original language Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films
Field of research 2. Engineering and technology
Sub-field of research 2.4 Chemical engineering
Authors Janīna Sētiņa
Gundars Mežinskis
Vasīlijs Akišins
Keywords anti-reflectance thin films , magnetron sputtering, optical properties
Abstract This article gives an overview of anti-reflection characterization of SiO2 and TiO2 multilayer thin films on flat glass substrate obtained by magnetron sputtering. Optical properties (refractive index, reflectance, transmission) were determined, and discussed in connection with surface morphology of films studied by means of atomic force microscopy.
Reference Sētiņa, J., Mežinskis, G., Akišins, V. Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films. In: ICG Annual Meeting 2011: 1st Hi-Tech International Forum on Glass, China, Shenzhen, 30 Mar-2 Apr., 2011. Shenzhen: China Triumph International Engineering Co., Ltd, 2011, pp.47-48.
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