Measurement Circuits and Data Processing for Transistor 1/f Noise Parameter Extraction

2002
Māris Zeltiņš, Ilmārs Slaidiņš

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Keywords
Transistor, 1/f Noise, Measurement Circuit, Parameter Extraction
Hyperlink
http://alephfiles.rtu.lv/TUA01/000011799_e.pdf

Zeltiņš, M., Slaidiņš, I. Measurement Circuits and Data Processing for Transistor 1/f Noise Parameter Extraction. Telecommunications and Electronics. Vol.2, 2002, pp.17-21. ISSN 1407-8880.

Publication language
English (en)