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Publikācija: Comparison of Fixed Point Arithmetic Errors for the FPGA-Based CRAIMOT Basis Function Generators

Publication Type Full-text conference paper published in other conference proceedings
Funding for basic activity Unknown
Defending: ,
Publication language English (en)
Title in original language Comparison of Fixed Point Arithmetic Errors for the FPGA-Based CRAIMOT Basis Function Generators
Field of research 2. Engineering and technology
Sub-field of research 2.2 Electrical engineering, Electronic engineering, Information and communication engineering
Authors Māris Tērauds
Gatis Valters
Uldis Derums
Nauris Vasiļevskis
Peteris Misāns
Keywords CORDIC algorithm, Fixed point errors, FPGA, Generation of basis functions
Abstract This paper describes the mean square error (MSE) of basis function (BF) caused by the quantization of sine/cosine values. MSEs for all CRAIMOT BFs are equal. Additionally, MSEs are estimated for random signals synthesized by a limited number of weighted CRAIMOT BFs (partial sum). Maximal and minimal MSEs are given in dependence on the wordlength of sine/cosine former and the number of BFs used for synthesis. Synthesis error is independent of the number of BFs, practically constant. Errors are compared for two versions of FPGA implemented BF generator and synthesizer. Versions of mentioned devices differ by sine/cosine former blocks implemented using CORDIC and optimal linear interpolation algorithms. A CORDIC former ensures approximately twice better accuracy. A preliminary simulation has been conducted and it has proved the existence of optimal angles (optimal transforms) from the implementation point of view.
DOI: 10.1109/NORCHP.2008.4738293
Hyperlink: http://ieeexplore.ieee.org.resursi.rtu.lv/xpl/articleDetails.jsp?arnumber=4738293 
Reference Tērauds, M., Valters, G., Derums, U., Vasiļevskis, N., Misāns, P. Comparison of Fixed Point Arithmetic Errors for the FPGA-Based CRAIMOT Basis Function Generators. In: Proceedings (on flash memory) of the 26th IEEE Norchip 2008 Conference (on flash memory), Estonia, Tallinn, 16-18 November, 2008. Tallinn: Technoconsult DK, IEEE, 2008, pp.108-113. ISBN 9781424424924. e-ISBN 9781424424931. Available from: doi:10.1109/NORCHP.2008.4738293
ID 4064