Nosaukums angļu valodā Aeris Research table-type X-ray diffractometer, 300 W
Kristaps Rubenis, Jānis Ločs

Description of the Technology

 X - ray diffractometer (XRD) for table mounting.
- The device is equipped with a Cu LFF X-ray lamp with a power of 600 W, Ni type β filter.
- Equipment lamp generator 40 kV
- Vertical goniometer with Brag-Brentanno geometry
- Goniometer radius 145 mm
- The measuring range 2θ is -4 ° to 142 °, the minimum measuring step 2θ is 0.001 °.
- The angular resolution in the range is 0.04 ° 2θ over the entire angular range.
- The maximum sample scanning speed is 2.17 ° / s.
- 6-position sample changer, which allows samples to be replenished and inserted into the sample changer without opening the measuring chamber and without interrupting the measurements of the existing sample. The sample changer provides a continuous sequence of measurements.



Applications

Determination and characterization of the material’s crystal structure.



Advantages

Vacuum 10-1 … 10-3 Pa



Keywords

Aeris X-ray diffractometer,XRD

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