Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

Latvian Journal of Physics and Technical Sciences 2022
Ainārs Ozols, Gatis Mozolevskis, Raivis Žalubovskis, Mārtiņš Rutkis

We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

Keywords
Cell gap | COMSOL | fast switching diffusers | LCD
DOI
10.2478/lpts-2022-0031
Hyperlink
https://sciendo.com/article/10.2478/lpts-2022-0031

Ozols, A., Mozolevskis, G., Žalubovskis, R., Rutkis, M. Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays. Latvian Journal of Physics and Technical Sciences, 2022, Vol. 59, No. 4, pp.25-35. ISSN 0868-8257. e-ISSN 2255-8896. Available from: doi:10.2478/lpts-2022-0031

Publication language
English (en)