PbS Nanodots in ZrO2 Thin-Film Matrix as a Possible Material for Microdosimetry of Ionizing Radiation
International Conference “Functional Materials and Nanotechnologies (FM&NT-2012)”: Book of Abstracts 2012
Jurijs Dehtjars, Aleksejs Kataševs, Renata Reisfeld, Marina Romanova, Tsiala Saraidarov, Karīna Stalidzāne

Lead sulfide (PbS) nanodots embedded in a thin layer of zirconia (ZrO2) (ZrO2:PbS thin films) can be a promising material for radiation dosimetry purposes [1]. Application of the ZrO2:PbS thin films for microdosimetry of ionizing electron radiation was studied in this research. Spatial resolution of the radiation dosimeter is important in microdosimetry. This means it is important to define the smallest sensitive area of the dosimeter that can respond to radiation. To estimate the detection resolution of the ZrO2:PbS films, the samples were irradiated with 6 MeV electron beam using medical linear accelerator. One half of each sample was covered with radiation attenuating material (2.3 mm thick aluminium plate). This resulted in scattering of the electrons on the border between the irradiated and covered parts of the samples. It was hypothesized that electron scattering distance limited the resolution of the potential dosimeter. Electron scattering distance was estimated by scanning surface electrical potential of the films in the direction from the covered to the irradiated part perpendicularly to the border line. Measurements were done using Kelvin mode of atomic force microscopy. The film surface right and left to the border line had an increased value of the electrical potential in comparison with the other parts of the films. It was found that the electron scattering distance depended on the concentration of the PbS nanodots in the ZrO2 matrix. The estimated electron scattering distance was: in the ZrO2:20%PbS films ~ 1.5 mm; in the ZrO2:10%PbS films ~ 0.6 mm; in the ZrO2 matrix ~ 0.4 mm. It was supposed that increase in the concentration of the PbS nanodots might have resulted in possible deterioration of the ZrO2:PbS dosimeter spatial resolution. Perhaps this was due to the electron scattering on PbS nanodots.


Atslēgas vārdi
PbS nanodots, electron radiation, dosimetry, kelvin probe force microscopy
Hipersaite
http://www.fmnt.lu.lv/fileadmin/user_upload/lu_portal/projekti/konference_fmnt/2012/FM_NT2012_FINAL_for_internet_2.pdf

Dehtjars, J., Kataševs, A., Reisfeld, R., Romanova, M., Saraidarov, T., Stalidzāne, K. PbS Nanodots in ZrO2 Thin-Film Matrix as a Possible Material for Microdosimetry of Ionizing Radiation. No: International Conference “Functional Materials and Nanotechnologies (FM&NT-2012)”: Book of Abstracts, Latvija, Rīga, 17.-20. aprīlis, 2012. Riga: Institute of Solid State Physics. University of Latvia, 2012, 87.-87.lpp. ISBN 978-9984-45-496-2.

Publikācijas valoda
English (en)
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