Non-Contact Measurement of the Thickness and Dielectric Parameters of Dielectric Plates and Shells

Latvian Journal of Physics and Technical Sciences 2015
Imants Matīss

© 2015 by I. Matiss. The paper describes a new approach for non-destructive testing of the structural and geometric parameters of dielectric objects using capacitance techniques. The novelty of this approach lies in the design of a capacitance sensor comprising an array of electrodes with changeable potential distribution on them during a measurement process. This makes solvable the problem of measuring independently three input parameters. To demonstrate the capabilities of the developed measurement algorithms, the case studies based on computer simulation have been carried out.

Atslēgas vārdi
capacitance sensors | computer simulation | dielectric characteristics | multiparameter measurements
DOI
10.1515/lpts-2015-0011
Hipersaite
http://www.degruyter.com/view/j/lpts.2015.52.issue-2/lpts-2015-0011/lpts-2015-0011.xml

Matīss, I. Non-Contact Measurement of the Thickness and Dielectric Parameters of Dielectric Plates and Shells. Latvian Journal of Physics and Technical Sciences, 2015, Vol.52, Iss.2, 49.-58.lpp. ISSN 0868-8257. Pieejams: doi:10.1515/lpts-2015-0011

Publikācijas valoda
English (en)