Accelerated Life Testing in Reliability Evaluation of Power Electronics Assemblies

2018 IEEE 59th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON 2018): Proceedings 2018
Oskars Bormanis, Leonīds Ribickis

Reliability tests for assessment of service life in power electronics product lifecycle are investigated. Paper reviews basic principles of highly accelerated life test and multiple environment over stress tests. Failure types revealed during the accelerated life tests are discussed as well as practical examples of the tests from industry.

Atslēgas vārdi
Reliability engineering, Electronic equipment manufacture, Electronic equipment testing
DOI
10.1109/RTUCON.2018.8659911
Hipersaite
https://ieeexplore.ieee.org/document/8659911

Bormanis, O., Ribickis, L. Accelerated Life Testing in Reliability Evaluation of Power Electronics Assemblies. No: 2018 IEEE 59th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON 2018): Proceedings, Latvija, Riga, 12.-14. novembris, 2018. Piscataway: IEEE, 2018, 195.-199.lpp. ISBN 978-1-5386-6904-4. e-ISBN 978-1-5386-6903-7. Pieejams: doi:10.1109/RTUCON.2018.8659911

Publikācijas valoda
English (en)