Fundamental Frequency Impact on Vilnius Chaos Oscillator Dynamics
16th Chaotic Modeling and Simulation International Conference (CHAOS 2023): Conference Proceedings. Springer Proceedings in Complexity 2024
Darja Čirjuļina, Ruslans Babajans, Filips Čapligins, Anna Litviņenko

Numerous oscillator circuits with chaotic behavior have been proposed in the literature. The employment of such oscillators has the potential to ensure secure communication between wireless sensor network nodes at low implementation costs. However, the main shortcoming of the chaos oscillators is extreme sensitivity to initial parameter offset, which becomes more explicit with the increase of the oscillation’s frequency. Thus, studying the chaos oscillator element nominal value variation impact on dynamics and synchronization between the two chaotic circuits at different fundamental frequencies is necessary. The Vilnius chaos oscillator was chosen for this study, with 1.6 and 160 kHz fundamental frequencies. The study has been performed using simulations and experimental analysis of the oscillator’s prototype. In both studies, the synchronization is evaluated by calculating the correlation coefficient and employing a chaos 0–1 test to rate oscillator dynamics. This research reveals regions of stable operation and the most sensitive elements that influence the chaotic dynamics of the oscillator.


Atslēgas vārdi
Chaos, Chaotic modeling, Chaotic oscillator, Chaotic synchronization simulation, Chaotic simulation, Prototype, Prototype measurements
DOI
10.1007/978-3-031-60907-7_8
Hipersaite
https://link.springer.com/book/10.1007/978-3-031-60907-7

Čirjuļina, D., Babajans, R., Čapligins, F., Litviņenko, A. Fundamental Frequency Impact on Vilnius Chaos Oscillator Dynamics. No: 16th Chaotic Modeling and Simulation International Conference (CHAOS 2023): Conference Proceedings. Springer Proceedings in Complexity, Grieķija, Iraklija, 13.-16. jūnijs, 2023. Cham: Springer Nature Switzerland, 2024, 87.-101.lpp. ISBN 978-3-031-60906-0. e-ISBN 978-3-031-60907-7. ISSN 2213-8684. e-ISSN 2213-8692. Pieejams: doi:10.1007/978-3-031-60907-7_8

Publikācijas valoda
English (en)
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