RTU Research Outputs and Resources: Reasearch Staff

Dedicated to the Memory of Prof. M. Sheinkman Effect of Ultrasonic Treatment on the Defect Structure of the Si-SiO2 System
(2014)

D. Kropman, S. Dolgov, Pāvels Onufrijevs, Edvīns Daukšta
Scientific article indexed in SCOPUS or WOS database

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

D. Kropman, E. Mellokov, T. Kärner, T. Laas, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Scientific article indexed in SCOPUS or WOS database

Stresses Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

D. Kropman, E. Mellikov, T. Kärner, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Conference paper

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface
(2011)

D. Kropman, E. Mellikov, T. Kärner, Artūrs Medvids, Pāvels Onufrijevs, Edvīns Daukšta
Scientific article indexed in SCOPUS or WOS database

Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and Its Influence on the Interface Properties
(2008)

U. Abru, I. Heinmaa, T. Kärner, D. Kropman, T. Laas, Artūrs Medvids, E. Mellikov, U. Ugaste
Scientific article indexed in ERIH database, in INT1 or INT2 category journals

Strain Relaxation Mechanism in the Si-Sio2 System and Its Influence on the Interface Properties
(2008)

I Heinmaa, T. Kärner, D. Kropman, T. Laas, K. Lott, Artūrs Medvids, E. Mellikov, A. Opik, O. Volobueva
Full-text conference paper published in other conference proceedings

Impurities Interaction with Point Defects in the Si- SiO2 System and Its Influence on the Interface Properties
(2008)

I. Heinmaa, T. Kärner, D. Kropman, T. Laas, K. Lott, Artūrs Medvids, E. Mellikov, A. Opik
Conference paper

Information about Author

Publications

Dedicated to the Memory of Prof. M. Sheinkman Effect of Ultrasonic Treatment on the Defect Structure of the Si-SiO2 System
(2014)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

Stresses Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface
(2011)

Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and Its Influence on the Interface Properties
(2008)

Strain Relaxation Mechanism in the Si-Sio2 System and Its Influence on the Interface Properties
(2008)

Impurities Interaction with Point Defects in the Si- SiO2 System and Its Influence on the Interface Properties
(2008)

Information about Author

Publications

Dedicated to the Memory of Prof. M. Sheinkman Effect of Ultrasonic Treatment on the Defect Structure of the Si-SiO2 System (2014)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface Properties (2011)

Stresses Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties (2011)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface (2011)

Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and Its Influence on the Interface Properties (2008)

Strain Relaxation Mechanism in the Si-Sio2 System and Its Influence on the Interface Properties (2008)

Impurities Interaction with Point Defects in the Si- SiO2 System and Its Influence on the Interface Properties (2008)

Dedicated to the Memory of Prof. M. Sheinkman Effect of Ultrasonic Treatment on the Defect Structure of the Si-SiO2 System
(2014)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

Stresses Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2011)

Stress Relaxation Mechanism by Strain in the Si-SiO2 System and Its Influence on the Interface
(2011)

Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and Its Influence on the Interface Properties
(2008)

Strain Relaxation Mechanism in the Si-Sio2 System and Its Influence on the Interface Properties
(2008)

Impurities Interaction with Point Defects in the Si- SiO2 System and Its Influence on the Interface Properties
(2008)