Information about Author
Name, Surname:

Daniel Kropman

Publications
4 items found, displaying 1 to 4.
Stress Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2016)
Daniel Kropman, Viktor Seeman, Sergei Dolgov, Ivo Heinmaa, Artūrs Medvids
Full-text conference paper published in conference proceedings indexed in SCOPUS or WOS database
Stresses Relaxation in the Si-SiO2 System and Its Influence on the Interface Properties
(2016)
Daniel Kropman, Tõnu Laas, Viktor Seeman, Artūrs Medvids
Scientific article indexed in SCOPUS or WOS database
Interaction of Point Defects with Impurities in the Si-SiO2 System and Its Influence on the Properties of the Interface
(2010)
Daniel Kropman, E. Mellikov, K. Lott, T. Kärner, I. Heinmaa, Tony Laas, Artūrs Medvids, Wolfgang Skorupa, S. Prucnal, S. Zvyagin, E. Cizmar, M. Ozerov, J. Woznitsa
Publication (anonimusly reviewed) in a journal with an international editorial board indexed in other databases
Strain Relaxation Mechanism in the Si-SiO2 System and Its Influence on the Interface Properties
(2009)
Daniel Kropman, E. Mellikov, A. Opik, K. Lott, O. Volobueva, T. Kärner, I. Heinmaa, T. Laas, Artūrs Medvids
Publication (anonimusly reviewed) in a journal with an international editorial board indexed in other databases

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