Investigation of TiO2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy
Key Engineering Materials 2012
Kristaps Rubenis, Kārlis Kundziņš, Jānis Ločs, Jurijs Ozoliņš

Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.


Atslēgas vārdi
TiO2, ceramic, microstructure, electrical conductivity, atomic force microscopy
DOI
10.4028/www.scientific.net/KEM.527.154

Rubenis, K., Kundziņš, K., Ločs, J., Ozoliņš, J. Investigation of TiO2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy. Key Engineering Materials, 2012, 527, 154.-158.lpp. ISSN 1662-9795. Pieejams: doi:10.4028/www.scientific.net/KEM.527.154

Publikācijas valoda
English (en)
RTU Zinātniskā bibliotēka.
E-pasts: uzzinas@rtu.lv; Tālr: +371 28399196