Estimation of Structural Stability of Tungsten-Boron Thin Films at Elevated Temperatures
24th International Conference-School "Advanced Materials and Technologies": Book of Abstracts
2022
Līga Avotiņa,
Annija Elizabete Goldmane,
Edgars Vanags,
Aija Trimdale-Deksne,
Lada Bumbure,
Marina Romanova,
Hermanis Sorokins,
Alexei Muhin,
Aleksandrs Zaslavskis,
Gunta Kizane,
Jurijs Dehtjars
Structural stability of W-B films deposited on Si/SiO2 substrates by magnetron sputtering technique was studied. The films were oxidized in a thermal analysis device. Properties of the films before and after thermal treatment were studied using FTIR, XRD, SEM and EDX techniques.
Atslēgas vārdi
tungsten, boron, thin films, FTIR
Hipersaite
https://www.ebooks.ktu.lt/eb/1600/advanced-materials-and-technologies-book-of-abstracts-of-24th-international-conference-school/
Avotiņa, L., Goldmane, A., Vanags, E., Trimdale-Deksne, A., Bumbure, L., Romanova, M., Sorokins, H., Muhin, A., Zaslavskis, A., Kizane, G., Dehtjars, J. Estimation of Structural Stability of Tungsten-Boron Thin Films at Elevated Temperatures. No: 24th International Conference-School "Advanced Materials and Technologies": Book of Abstracts, Lietuva, Palanga, 22.-26. augusts, 2022. Kaunas: Kaunas University of Technology, 2022, 38.-38.lpp. e-ISSN 2669-1930.
Publikācijas valoda
English (en)