RTU Zinātniskās darbības rezultāti un resursi: Personāls

Surface Morphology of Single and Multi-Layer Silicon Nitride Dielectric Nano-Coatings on Silicon Dioxide and Polycrystalline Silicon
(2020)

Līga Avotiņa, Elina Pajuste, Marina Romanova, Gennady Enichek, Aleksandrs Zaslavskis, Valentina Kinerte, Jūris Avotiņš, Jurijs Dehtjars, Gunta Ķizāne
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Infrared Spectrometry Application for Studies of Radiation Stability of Si3N4 Nanofilms
(2020)

Līga Avotiņa, Elina Pajuste, Marina Romanova, Aleksandrs Zaslavskis, Jurijs Dehtjars, Gunta Kizane
Raksts konferenču tēžu krājumā

Strong, Rapid, and Reversible Photochromic Response of Nb Doped TiO2 Nanocrystal Colloids in Hole Scavenging Media
(2020)

Raivis Eglītis, Urmas Joost, Anzelms Zukuls, Kristaps Rubenis, Reinis Ignatāns, Līga Avotiņa, Larisa Baumane, Krišjānis Šmits, Mika Hirsimaki, Tanel Kaambre, Andris Šutka
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Jurijs Dehtjars, Līga Avotiņa, Gennady Enichek, Marina Romanova, Ben Schmidt, Evgeny Shulzinger, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavski
Publikācijas konferenču materiālos, kas ir indeksēti Web of Science un/vai SCOPUS

Electrical Properties of Single and Multilayer Silicon Nitride Dielectric for Applications in Nanocapacitors
(2019)

Līga Avotiņa, Marina Romanova, Elina Pajuste, Gennady Enichek, Aleksandrs Zaslavskis, Jurijs Dehtjars, Gunta Ķizāne
Raksts konferenču tēžu krājumā

Radiation Stability of Multilayer Silicon Nitride Nanocapacitors
(2019)

Līga Avotiņa, Jurijs Dehtjars, Genādijs Jenichek, Gunta Ķizāne, Elina Pajuste, Marina Romanova, Thomas Alexander Yager, Aleksandrs Zaslavskis
Raksts konferenču tēžu krājumā

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Mindaugas Andrulevičius, Līga Avotiņa, Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Evgeny Shulzinger, Hermanis Sorokins, Sigitas Tamulevičius, Aleksandrs Viļķens, Aleksandr Zaslavski
Raksts konferenču tēžu krājumā

Surface Morphology of Single and Multilayered Silicon Nitride Dielectric Nanocoatings
(2018)

Elina Pajuste, Marina Romanova, Līga Avotiņa, Gennady Enichek, Aleksandrs Zaslavskis, Valentina Kinerte, Jurijs Dehtjars, Gunta Ķizāne
Raksts konferenču tēžu krājumā

Modifications of Silicon Nitride Bonds under Action of Accelerated Electrons
(2018)

Līga Avotiņa, Elina Pajuste, Marina Romanova, Aleksandrs Zaslavskis, Gennady Enichek, Valentina Kinerte, Jurijs Dehtjars, Gunta Ķizāne
Raksts konferenču tēžu krājumā

FTIR Analysis of Electron Irradiated Single and Multilayer Si3N4 Coatings
(2018)

Līga Avotiņa, Elina Pajuste, Marina Romanova, Aleksandrs Zaslavskis, Gennady Enichek, Valentina Kinerte, Artūrs Zariņš, Bronislavs Lescinskis, Jurijs Dehtjars, Gunta Ķizāne
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Informācija par autoru

Publikācijas

Surface Morphology of Single and Multi-Layer Silicon Nitride Dielectric Nano-Coatings on Silicon Dioxide and Polycrystalline Silicon
(2020)

Infrared Spectrometry Application for Studies of Radiation Stability of Si3N4 Nanofilms
(2020)

Strong, Rapid, and Reversible Photochromic Response of Nb Doped TiO2 Nanocrystal Colloids in Hole Scavenging Media
(2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Electrical Properties of Single and Multilayer Silicon Nitride Dielectric for Applications in Nanocapacitors
(2019)

Radiation Stability of Multilayer Silicon Nitride Nanocapacitors
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Surface Morphology of Single and Multilayered Silicon Nitride Dielectric Nanocoatings
(2018)

Modifications of Silicon Nitride Bonds under Action of Accelerated Electrons
(2018)

FTIR Analysis of Electron Irradiated Single and Multilayer Si3N4 Coatings
(2018)

Patenti

Plāna daudzslāņu dielektriķa nogulsnēšanas paņēmiens
LV15492B (20.10.2020.)

Informācija par autoru

Publikācijas

Surface Morphology of Single and Multi-Layer Silicon Nitride Dielectric Nano-Coatings on Silicon Dioxide and Polycrystalline Silicon (2020)

Infrared Spectrometry Application for Studies of Radiation Stability of Si3N4 Nanofilms (2020)

Strong, Rapid, and Reversible Photochromic Response of Nb Doped TiO2 Nanocrystal Colloids in Hole Scavenging Media (2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency (2019)

Electrical Properties of Single and Multilayer Silicon Nitride Dielectric for Applications in Nanocapacitors (2019)

Radiation Stability of Multilayer Silicon Nitride Nanocapacitors (2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures (2019)

Surface Morphology of Single and Multilayered Silicon Nitride Dielectric Nanocoatings (2018)

Modifications of Silicon Nitride Bonds under Action of Accelerated Electrons (2018)

FTIR Analysis of Electron Irradiated Single and Multilayer Si3N4 Coatings (2018)

Patenti

Plāna daudzslāņu dielektriķa nogulsnēšanas paņēmiens LV15492B (20.10.2020.)

Surface Morphology of Single and Multi-Layer Silicon Nitride Dielectric Nano-Coatings on Silicon Dioxide and Polycrystalline Silicon
(2020)

Infrared Spectrometry Application for Studies of Radiation Stability of Si3N4 Nanofilms
(2020)

Strong, Rapid, and Reversible Photochromic Response of Nb Doped TiO2 Nanocrystal Colloids in Hole Scavenging Media
(2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Electrical Properties of Single and Multilayer Silicon Nitride Dielectric for Applications in Nanocapacitors
(2019)

Radiation Stability of Multilayer Silicon Nitride Nanocapacitors
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Surface Morphology of Single and Multilayered Silicon Nitride Dielectric Nanocoatings
(2018)

Modifications of Silicon Nitride Bonds under Action of Accelerated Electrons
(2018)

FTIR Analysis of Electron Irradiated Single and Multilayer Si3N4 Coatings
(2018)

Plāna daudzslāņu dielektriķa nogulsnēšanas paņēmiens
LV15492B (20.10.2020.)