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Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission
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Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē
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2020 |
Jurijs Dehtjars,
Gennady Enichek,
Marina Romanova,
Ben Schmidt,
Aleksandrs Viļķens,
Thomas Alexander Yager,
Alexandr Zaslavski
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Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms
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Raksts konferenču tēžu krājumā
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2020 |
Marina Romanova,
Sergii Chertopalov,
Jurijs Dehtjars,
Ladislav Fekete,
Jan Lancok,
Michal Novotny,
Aleksandrs Viļķens
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Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
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Publikācijas konferenču materiālos, kas ir indeksēti Web of Science un/vai SCOPUS
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2019 |
Jurijs Dehtjars,
Līga Avotiņa,
Gennady Enichek,
Marina Romanova,
Ben Schmidt,
Evgeny Shulzinger,
Hermanis Sorokins,
Aleksandrs Viļķens,
Aleksandrs Zaslavski
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Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
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Citas publikācijas konferenču (arī vietējo) ziņojumu izdevumos
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2018 |
Liga Avotina,
Jurijs Dehtjars,
Marina Romanova,
Evgeny Shulzinger,
Ben Schmidt,
Aleksandrs Viļķens,
Aleksandr Zaslavski,
Gennady Enichek
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XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
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Raksts konferenču tēžu krājumā
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2019 |
Mindaugas Andrulevičius,
Līga Avotiņa,
Jurijs Dehtjars,
Gennady Enichek,
Marina Romanova,
Evgeny Shulzinger,
Hermanis Sorokins,
Sigitas Tamulevičius,
Aleksandrs Viļķens,
Aleksandr Zaslavski
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