RTU Zinātniskās darbības rezultāti un resursi: Personāls

Publikācijas

Atrasti 10 rezultāti tiek attēloti no 1 līdz 10.

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2025)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Petr Pokorny, Anatoli Popov, Hermanis Sorokins, Aleksandrs Viļķens
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2024)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Jan Lancok, Michal Novotny, Petr Pokorny, A.I. Popov, Aleksandrs Viļķens
Raksts konferenču tēžu krājumā

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique
(2023)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Aleksandrs Viļķens
Raksts konferenču tēžu krājumā

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies
(2023)

Līga Avotiņa, Liga Bikse, Jurijs Dehtjars, Annija Elizabete Goldmane, Gunta Ķizāne, Aleksei Muhin, Marina Romanova, Krišjānis Šmits, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavskis
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films
(2021)

Marina Romanova, Regīna Burve, Jurijs Dehtjars, Vera Serga, Aleksandrs Viļķens
Raksts konferenču tēžu krājumā

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission
(2020)

Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Ben Schmidt, Aleksandrs Viļķens, Thomas Alexander Yager, Alexandr Zaslavski
Zinātniskais raksts, kas indeksēts Web of science un/vai Scopus datu bāzē

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms
(2020)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Aleksandrs Viļķens
Raksts konferenču tēžu krājumā

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Jurijs Dehtjars, Līga Avotiņa, Gennady Enichek, Marina Romanova, Ben Schmidt, Evgeny Shulzinger, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavski
Publikācijas konferenču materiālos, kas ir indeksēti Web of Science un/vai SCOPUS

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Mindaugas Andrulevičius, Līga Avotiņa, Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Evgeny Shulzinger, Hermanis Sorokins, Sigitas Tamulevičius, Aleksandrs Viļķens, Aleksandr Zaslavski
Raksts konferenču tēžu krājumā

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Liga Avotina, Jurijs Dehtjars, Marina Romanova, Evgeny Shulzinger, Ben Schmidt, Aleksandrs Viļķens, Aleksandr Zaslavski, Gennady Enichek
Citas publikācijas konferenču (arī vietējo) ziņojumu izdevumos

Projekti

Atrasti 3 rezultāti tiek attēloti no 1 līdz 3.

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā
Citi

Jurijs Dehtjars

Biomedicīnas inženierzin.un nanotehnoloģ.institūts (34-25200-RSFF.BINI)

Jurijs Dehtjars

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6)
Citi

Jurijs Dehtjars

Informācija par autoru

Publikācijas

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses (2025)

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses (2024)

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique (2023)

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies (2023)

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films (2021)

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission (2020)

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms (2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency (2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures (2019)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor (2018)

Projekti

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā Citi

Biomedicīnas inženierzin.un nanotehnoloģ.institūts (34-25200-RSFF.BINI)

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6) Citi

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2025)

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2024)

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique
(2023)

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies
(2023)

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films
(2021)

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission
(2020)

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms
(2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā
Citi

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6)
Citi