RTU Research Outputs and Resources: Reasearch Staff

Information about Author

Name, Surname:

Evgeny Shulzinger

Scientific Degree:

Doktors

E-mail:

Evgeny.Shulzinger(at)rtu.lv

Publications

5 items found, displaying 1 to 5.

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Jurijs Dehtjars, Līga Avotiņa, Gennady Enichek, Marina Romanova, Ben Schmidt, Evgeny Shulzinger, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavski
Full-text conference paper published in conference proceedings indexed in SCOPUS or WOS database

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Mindaugas Andrulevičius, Līga Avotiņa, Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Evgeny Shulzinger, Hermanis Sorokins, Sigitas Tamulevičius, Aleksandrs Viļķens, Aleksandr Zaslavski
Conference paper

Corrigendum to “Physical Mechanisms of Interaction of Cold Plasma with Polymer Surfaces” (Journal of Colloid And Interface Science (2015) 448 (175–179), (S0021979715001812), (10.1016/j.jcis.2015.02.025))
(2019)

Edvard Bormashenko, Gennady Whyman, Victor Multanen, Evgeny Shulzinger, Gilad Chaniel
Scientific article indexed in SCOPUS or WOS database

Co-occurrence of the Benford-like and Zipf Laws Arising from the Texts Representing Human and Artificial Languages
(2018)

Evgeny Shulzinger, Irina Legchenkova, Edward Bormashenko
Publication (reviewed) in journals with editorial board published in Latvia or abroad, including institutional juornals

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Liga Avotina, Jurijs Dehtjars, Marina Romanova, Evgeny Shulzinger, Ben Schmidt, Aleksandrs Viļķens, Aleksandr Zaslavski, Gennady Enichek
Full-text conference paper published in other conference proceedings

Information about Author

Publications

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Corrigendum to “Physical Mechanisms of Interaction of Cold Plasma with Polymer Surfaces” (Journal of Colloid And Interface Science (2015) 448 (175–179), (S0021979715001812), (10.1016/j.jcis.2015.02.025))
(2019)

Co-occurrence of the Benford-like and Zipf Laws Arising from the Texts Representing Human and Artificial Languages
(2018)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Projects

Daudzslāņu silīcija nanokondensators ar uzlabotiem dielektriskiem slāņiem
Citi

Information about Author

Publications

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency (2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures (2019)

Corrigendum to “Physical Mechanisms of Interaction of Cold Plasma with Polymer Surfaces” (Journal of Colloid And Interface Science (2015) 448 (175–179), (S0021979715001812), (10.1016/j.jcis.2015.02.025)) (2019)

Co-occurrence of the Benford-like and Zipf Laws Arising from the Texts Representing Human and Artificial Languages (2018)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor (2018)

Projects

Daudzslāņu silīcija nanokondensators ar uzlabotiem dielektriskiem slāņiem Citi

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Corrigendum to “Physical Mechanisms of Interaction of Cold Plasma with Polymer Surfaces” (Journal of Colloid And Interface Science (2015) 448 (175–179), (S0021979715001812), (10.1016/j.jcis.2015.02.025))
(2019)

Co-occurrence of the Benford-like and Zipf Laws Arising from the Texts Representing Human and Artificial Languages
(2018)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Daudzslāņu silīcija nanokondensators ar uzlabotiem dielektriskiem slāņiem
Citi