RTU Research Outputs and Resources: Reasearch Staff

Publications

10 items found, displaying 1 to 10.

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2025)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Petr Pokorny, Anatoli Popov, Hermanis Sorokins, Aleksandrs Viļķens
Scientific article indexed in SCOPUS or WOS database

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2024)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Jan Lancok, Michal Novotny, Petr Pokorny, A.I. Popov, Aleksandrs Viļķens
Conference paper

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique
(2023)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Aleksandrs Viļķens
Conference paper

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies
(2023)

Līga Avotiņa, Liga Bikse, Jurijs Dehtjars, Annija Elizabete Goldmane, Gunta Ķizāne, Aleksei Muhin, Marina Romanova, Krišjānis Šmits, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavskis
Scientific article indexed in SCOPUS or WOS database

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films
(2021)

Marina Romanova, Regīna Burve, Jurijs Dehtjars, Vera Serga, Aleksandrs Viļķens
Conference paper

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission
(2020)

Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Ben Schmidt, Aleksandrs Viļķens, Thomas Alexander Yager, Alexandr Zaslavski
Scientific article indexed in SCOPUS or WOS database

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms
(2020)

Marina Romanova, Sergii Chertopalov, Jurijs Dehtjars, Ladislav Fekete, Jan Lancok, Michal Novotny, Aleksandrs Viļķens
Conference paper

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

Jurijs Dehtjars, Līga Avotiņa, Gennady Enichek, Marina Romanova, Ben Schmidt, Evgeny Shulzinger, Hermanis Sorokins, Aleksandrs Viļķens, Aleksandrs Zaslavski
Full-text conference paper published in conference proceedings indexed in SCOPUS or WOS database

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Mindaugas Andrulevičius, Līga Avotiņa, Jurijs Dehtjars, Gennady Enichek, Marina Romanova, Evgeny Shulzinger, Hermanis Sorokins, Sigitas Tamulevičius, Aleksandrs Viļķens, Aleksandr Zaslavski
Conference paper

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Liga Avotina, Jurijs Dehtjars, Marina Romanova, Evgeny Shulzinger, Ben Schmidt, Aleksandrs Viļķens, Aleksandr Zaslavski, Gennady Enichek
Full-text conference paper published in other conference proceedings

Projects

3 items found, displaying 1 to 3.

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā
Citi

Jurijs Dehtjars

Biomedicīnas inženierzin.un nanotehnoloģ.institūts (34-25200-RSFF.BINI)

Jurijs Dehtjars

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6)
Citi

Jurijs Dehtjars

Information about Author

Publications

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses (2025)

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses (2024)

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique (2023)

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies (2023)

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films (2021)

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission (2020)

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms (2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency (2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures (2019)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor (2018)

Projects

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā Citi

Biomedicīnas inženierzin.un nanotehnoloģ.institūts (34-25200-RSFF.BINI)

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6) Citi

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2025)

Charge Trapping in SiO2 Substrate during Electron Beam Deposition of CaF2 Thin Films of Different Thicknesses
(2024)

Electron Irradiation Effects on Si/SiO2/CaF2 Structures Studied by Photoelectron Emission Technique
(2023)

Tungsten-SiO2-Based Planar Field Emission Microtriodes with Different Electrode Topologies
(2023)

Charge Trapping in Si/SiO2 Substrate during TSEE Measurements of MgO Thin Films
(2021)

Charge Trap Analysis of Nanolayer Si3N4 and SiO2 by Electron Irradiation Assisted Photoelectron Emission
(2020)

Charge Trapping in Si/SiO2 Substrate during E-Beam Deposition of CaF2:EuF3 Nanofilms
(2020)

Interface of Silicon Nitride Nanolayers with Oxygen Deficiency
(2019)

XPS, FTIR and Photoelectron Emission Spectroscopies to Analyze Nanocapacitor Silicon Nitride Nano Layered Structures
(2019)

Silicon Nitride Multi Nanolayer System Fabricated in One Reactor
(2018)

Analogo elementu pētījumi, kas izmantoti Hi-End audio produktu ražošanā
Citi

Biomedicīnas inženierzin. un nanotehnoloģ.instit. (34-15D00-N7050.6)
Citi