Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films

ICG Annual Meeting 2011: 1st Hi-Tech International Forum on Glass 2011
Janīna Sētiņa, Gundars Mežinskis, Vasīlijs Akišins

This article gives an overview of anti-reflection characterization of SiO2 and TiO2 multilayer thin films on flat glass substrate obtained by magnetron sputtering. Optical properties (refractive index, reflectance, transmission) were determined, and discussed in connection with surface morphology of films studied by means of atomic force microscopy.

Atslēgas vārdi
anti-reflectance thin films , magnetron sputtering, optical properties

Sētiņa, J., Mežinskis, G., Akišins, V. Investigation of Influence of Enviromental Conditions to Surface of Antireflective Thin Films. No: ICG Annual Meeting 2011: 1st Hi-Tech International Forum on Glass, Ķīna, Shenzhen, 30. Mar-2. Apr., 2011. Shenzhen: China Triumph International Engineering Co., Ltd, 2011, 47.-48.lpp.

Publikācijas valoda
English (en)